和硬盘振动有关，表明硬盘受到剧烈的振动。
| 191 | 0xBF | G-sense Error Rate |
 |
The count of errors resulting from externally-induced shock & vibration. |
Rate of errors occurring as a result of impact loads. This attribute stores an indication of a shock-sensitive sensor, that is, the total quantity of errors occurring as a result of internal impact loads (dropping drive, wrong installation, etc.).
如下面一块故障硬盘SMART信息：
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-2.6.32-21-server] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Seagate Constellation ES (SATA)
Device Model: ST32000644NS
Serial Number: 9WM4D7ZZ
LU WWN Device Id: 5 000c50 02e0bf7fc
Firmware Version: SN12
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri Jul 29 14:01:24 2011 CST
SMART support is: Available – device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 609) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x10bd) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 080 063 044 Pre-fail Always – 101575538
3 Spin_Up_Time 0x0003 088 088 000 Pre-fail Always – 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always – 14
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always – 3 (3, 0)
7 Seek_Error_Rate 0x000f 066 060 030 Pre-fail Always – 4345140
9 Power_On_Hours 0x0032 099 098 000 Old_age Always – 1749
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always – 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always – 14
184 End-to-End_Error 0x0032 100 100 099 Old_age Always – 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always – 0
188 Command_Timeout 0x0032 100 100 000 Old_age Always – 4295032833
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always – 0
190 Airflow_Temperature_Cel 0x0022 076 062 045 Old_age Always – 24 (Min/Max 22/24)
191 G-Sense_Error_Rate 0x0032 072 072 000 Old_age Always – 56069
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always – 13
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always – 14
194 Temperature_Celsius 0x0022 024 040 000 Old_age Always – 24 (0 14 0 0)
195 Hardware_ECC_Recovered 0x001a 045 021 000 Old_age Always – 101575538
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always – 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline – 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always – 0
SMART Error Log Version: 1
ATA Error Count: 11 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 11 occurred at disk power-on lifetime: 1749 hours (72 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
04 71 03 80 01 32 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
b0 d0 00 00 4f c2 00 00 16d+22:56:18.227 SMART READ DATA
b0 d0 00 00 4f c2 00 00 16d+22:56:17.977 SMART READ DATA
b0 d0 00 00 4f c2 00 00 16d+22:55:55.724 SMART READ DATA
b0 d0 00 00 4f c2 00 00 16d+22:55:55.474 SMART READ DATA
ec 00 00 00 00 00 00 00 16d+15:02:16.947 IDENTIFY DEVICE
Error 10 occurred at disk power-on lifetime: 1749 hours (72 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
04 71 03 80 01 32 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
b0 d0 00 00 4f c2 00 00 16d+22:56:17.977 SMART READ DATA
b0 d0 00 00 4f c2 00 00 16d+22:55:55.724 SMART READ DATA
b0 d0 00 00 4f c2 00 00 16d+22:55:55.474 SMART READ DATA
ec 00 00 00 00 00 00 00 16d+15:02:16.947 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.926 IDENTIFY DEVICE
Error 9 occurred at disk power-on lifetime: 1749 hours (72 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
04 71 03 80 01 32 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
b0 d0 00 00 4f c2 00 00 16d+22:55:55.724 SMART READ DATA
b0 d0 00 00 4f c2 00 00 16d+22:55:55.474 SMART READ DATA
ec 00 00 00 00 00 00 00 16d+15:02:16.947 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.926 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.925 IDENTIFY DEVICE
Error 8 occurred at disk power-on lifetime: 1749 hours (72 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
04 71 03 80 01 32 40 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
b0 d0 00 00 4f c2 00 00 16d+22:55:55.474 SMART READ DATA
ec 00 00 00 00 00 00 00 16d+15:02:16.947 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.926 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.925 IDENTIFY DEVICE
00 00 00 00 00 00 00 ff 16d+15:02:13.019 NOP [Abort queued commands]
Error 7 occurred at disk power-on lifetime: 1741 hours (72 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
04 71 03 80 01 32 40
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
ec 00 00 00 00 00 00 00 16d+15:02:16.947 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.926 IDENTIFY DEVICE
ec 00 00 00 00 00 00 00 16d+15:02:16.925 IDENTIFY DEVICE
00 00 00 00 00 00 00 ff 16d+15:02:13.019 NOP [Abort queued commands]
ec 00 00 00 00 00 00 00 16d+15:02:12.984 IDENTIFY DEVICE
Error SMART Error Self-Test Log Read failed: scsi error aborted command
Smartctl: SMART Self Test Log Read Failed
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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